IMPROVING GRAIN YIELD AND YIELD COMPONENTS VIA BACKCROSS PROCEDURE

Chen, H. M.; Zhang, Y. D.; Chen, W.; Tan, J.; Wang, Y. F.; Yang, J. Y.; Fan, X. M.; Kang, M. S.; SCI

机构： Yunnan Acad Agr Sci, Inst Food Crops, Kunming 650205, Yunnan Province, Peoples R China; Louisiana State Univ, Dept Agron & Environ Management, Ctr Agr, Baton Rouge, LA 70803 USA;

关键词： grain yield homozygosity quantitative trait yield component backcross generation key agronomic trait selection